D2 PHASER

D2 PHASER - X-ray Powder Diffraction on a desktop

 

The D2 PHASER is a novel desktop X-ray diffraction tool enabling the analysis of poly-crystalline material. Equipped with an integrated PC and a flat screen monitor and the new and very easy-to-use workflow software DIFFRAC.SUITE allows measurement and analysis right out of the box. Mobile and easy to install with only the need for standard electrical power makes D2 PHASER ideal for laboratory or on-location operation; a true Plug’n Analyze system.

Easy to use and the price/performance leader for X-ray powder diffraction in laboratories and QC/PC applications for e.g. cement, industrial minerals, geology, chemistry, pharmaceuticals, as well as for educational purposes.

The D2 PHASER comes with a unique choice of detectors:

  • Scintillation counter for the entry into the world of X-ray powder diffraction
  • LYNXEYETM detector for collection of high quality X-ray powder diffraction data with unprecedented speed
  • XFlash® 430 detector for simultaneous acquisition of X-ray powder diffraction and X-ray fluorescence data

 

The LYNXEYETM is a 1-dimensional "compound silicon strip" detector for ultra fast X-ray diffraction measurements.

 

Collect high quality data with unprecedented speed, more than 150 times faster than a conventional point detector system.
LYNXEYE detector is optimized to meet the increasing demands in X-ray diffraction. Highest count rate capabilities and best angular resolution.
Operates with all common characteristic X-ray emission lines (Cr, Co, Cu, or Mo radiation) with an efficiency >90% (~40% for Mo radiation).
Sample fluorescence can be largely suppressed electronically to improve peak-to-background ratio. Factory settings are optimized for Cu-K-alpha.
Integrated electronics allows fast continuous diffraction scans with the LYNXEYETM as it is done with commonly used point detectors.

XFlash®430 for Combined XRD, EDXRD and XRF Analysis

XFlash detector can be switched to an arbitrary wavelength
For XRD, superb energy resolution allows for excellent filtration of undesirable Kβ, white radiation as well as sample fluorescence.
For standard powder XRD the Kα1,2dublett is employed, the XFlash detector can additionally be switched to an arbitrary wavelength within the X-ray spectrum. 
Observed line profile widths (FWHM) are identical to those of "classic" point detectors such as scintillation and proportional counters
EDXRD patterns at user-defined 2Ө positions. Extremly fast in analysis of coatings, or layers from different penetration depths.

 

Successful phase identification and quantitative analysis

XRF data are collected simultaneously with either XRD or EDXRD measurements, providing for element identification and monitoring of concentrations (K - Hf). Knowing the (partial) elemental composition of the sample greatly assists successful phase identification and quantitative analysis of unknown samples or of samples with similar diffraction patterns. Quantitative phase analysis results can be validated by comparing the calculated elemental composition with the actually measured elemental composition.

 

For more information about D2 PHASER click here

Download the D2 PHASER Brochure

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